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Features
· Controlled Baseline ? One Assembly/Test Site, One Fabrication Site Extended Temperature Performance up to ?55°C to 125°C
· Enhanced Diminishing Manufacturing Sources (DMS) Support
· Enhanced Product Change Notification
· Qualification Pedigree?
· 14-Bit Resolution
· 3- and 8-MSPS Speed Grade
· Differential Nonlinearity (DNL) ±0.6 LSB Typ
· Integral Nonlinearity (INL) ±1.5 LSB Typ
· Internal Reference
· Differential Inputs
· Programmable Gain Amplifier
· μP-Compatible Parallel Interface
· Timing Compatible With TMS320C6000 DSP
· 3.3-V Single Supply
· Power-Down Mode
· Monolithic CMOS Design
Applications
· xDSL Front Ends
· Communication
· Industrial Control
· Instrumentation
· Automotive and Selected Military
? Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
热门型号
热门资讯
20万现货SKU
品类不断扩充
科技智能大仓储
4小时快速交货
仅从原厂和代理商进货
每一颗料均可原厂追溯
明码标价节省时间成本
一站式采购正品元器件