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SN74AUC1G79DCKR_TI(德州仪器)中文资料_英文资料_价格_PDF手册

2024/3/31 11:28:19

429


SN74AUC1G79DCKR

单路正边沿触发式 D 型触发器

 

 

                                         更多技术详情请登录www.mroic.cn         


 

 

1 Features

 

• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II

• ESD Protection Exceeds JESD 22

– 2000-V Human-Body Model (A114-A)

– 200-V Machine Model (A115-A)

– 1000-V Charged-Device Model (C101)

• Available in the Texas Instruments NanoFree™ Package

• Optimized for 1.8-V Operation and Is 3.6-V I/O Tolerant to Support Mixed-Mode Signal Operation

• Ioff Supports Partial-Power-Down Mode Operation

• Sub-1-V Operable

• Max tpd of 1.9 ns at 1.8 V

• Low Power Consumption, 10-µA Maximum ICC

• ±8-mA Output Drive at 1.8 V

 

 

 

2 Applications

 

• AV Receiver

• Audio Dock: Portable

• Blu-Ray Player and Home Theater

• Embedded PC

• MP3 Player/Recorder (Portable Audio)

• Personal Digital Assistant (PDA)

• Power: Telecom/Server AC/DC Supply: Single Controller: Analog and Digital

• Solid State Drive (SSD): Client and Enterprise

• TV: LCD/Digital and High-Definition (HDTV)

• Tablet: Enterprise

• Video Analytics: Server

• Wireless Headset, Keyboard, and Mouse

 

                               


 

3 Description

 

This single positive-edge-triggered D-type flip-flop is operational at 0.8-V to 2.7-V VCC, but is designed specifically for 1.65-V to 1.95-V VCC operation.

 

When data at the data (D) input meets the setup time requirement, the data is transferred to the Q output on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at the D input can be changed without affecting the levels at the outputs.

 

NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the package.


               

 

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.